| Picture |
Part Number |
Manufacturer |
Package |
Quantity |
Description |
PDF |
Get Price |
|
SN74BCT8240ADWRE4 |
Texas Instruments |
24-SOIC (0.295", 7.50mm Width) |
100 |
IC SCAN TEST DEVICE BUFF 24-SOIC |
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SN74BCT8240ANT |
Texas Instruments |
24-DIP (0.300", 7.62mm) |
100 |
IC SCAN TEST DEVICE BUFF 24-DIP |
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SN74BCT8240ANTE4 |
Texas Instruments |
24-DIP (0.300", 7.62mm) |
100 |
IC SCAN TEST DEVICE BUFF 24-DIP |
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SN74BCT8244ADWR |
Texas Instruments |
24-SOIC (0.295", 7.50mm Width) |
100 |
IC SCAN TEST DEVICE BUFF 24-SOIC |
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SN74BCT8244ANT |
Texas Instruments |
24-DIP (0.300", 7.62mm) |
100 |
IC SCAN TEST DEVICE BUFF 24-DIP |
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SN74BCT8244ANTE4 |
Texas Instruments |
24-DIP (0.300", 7.62mm) |
100 |
IC SCAN TEST DEVICE BUFF 24-DIP |
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SN74BCT8245ANT |
Texas Instruments |
24-DIP (0.300", 7.62mm) |
100 |
IC SCAN TEST DEVICE TXRX 24-DIP |
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SN74BCT8245ANTE4 |
Texas Instruments |
24-DIP (0.300", 7.62mm) |
100 |
IC SCAN TEST DEVICE TXRX 24-DIP |
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SN74BCT8373ADWR |
Texas Instruments |
24-SOIC (0.295", 7.50mm Width) |
100 |
IC SCAN TEST DEVICE LATCH 24SOIC |
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SN74BCT8373ADWRE4 |
Texas Instruments |
24-SOIC (0.295", 7.50mm Width) |
100 |
IC SCAN TEST DEVICE LATCH 24SOIC |
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SN74BCT8373ANT |
Texas Instruments |
24-DIP (0.300", 7.62mm) |
100 |
IC SCAN TEST DEVICE LATCH 24-DIP |
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SN74BCT8374ADWR |
Texas Instruments |
24-SOIC (0.295", 7.50mm Width) |
100 |
IC SCAN TEST DEVICE W/FF 24-SOIC |
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SN74BCT8374ADWRE4 |
Texas Instruments |
24-SOIC (0.295", 7.50mm Width) |
100 |
IC SCAN TEST DEVICE W/FF 24-SOIC |
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SN74BCT8374ANT |
Texas Instruments |
24-DIP (0.300", 7.62mm) |
100 |
IC SCAN TEST DEVICE W/FF 24-DIP |
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SN74BCT8374ANTE4 |
Texas Instruments |
24-DIP (0.300", 7.62mm) |
100 |
IC SCAN TEST DEVICE W/FF 24-DIP |
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